Defect modeling Costs FDSOI Circuit faults Gem5 FPGA Formal proof Filtering Formal methods SCA Process variation Voltage Confusion coefficient Robustness Sensors Side-Channel Attacks Transistors ASIC Temperature sensors Power-constant logic Authentication Energy consumption Electromagnetic Signal processing algorithms Intrusion detection Countermeasures Cryptography Side-Channel Analysis SCA Image processing Differential Power Analysis DPA Masking countermeasure Spin transfer torque SoC Reverse engineering DRAM Fault injection Aging Loop PUF 3G mobile communication Magnetic tunnel junction Protocols Security and privacy PUF Power demand Field Programmable Gates Array FPGA Magnetic tunneling TRNG Dual-rail with Precharge Logic DPL Randomness Application-specific VLSI designs Hardware Side-channel attack Computational modeling Receivers Internet of Things Simulation Neural networks Countermeasure Information leakage STT-MRAM AES Linearity Fault injection attack Logic gates Asynchronous Resistance CRT Training Security services Estimation Reverse-engineering Field programmable gate arrays EMFI Switches CPA MRAM Memory Controller Side-channel attacks SCA OCaml Elliptic curve cryptography Convolution Coq Reliability Hardware security Security Mutual Information Analysis MIA RSA Fault attacks Side-channel analysis GSM Routing Differential power analysis DPA Dynamic range Machine learning Lightweight cryptography Masking Side-Channel Analysis Writing Side-channel attacks Random access memory